Rahul M. Rao, Keith A. Jenkins, Jae-Joon Kim. A Completely Digital On-Chip Circuit for Local-Random-Variability Measurement. In 2008 IEEE International Solid-State Circuits Conference, ISSCC 2008, Digest of Technical Papers, San Francisco, CA, USA, February 3-7, 2008. pages 412-413, IEEE, 2008. [doi]
Abstract is missing.