Joachim N. Burghartz, Mehmet Soyuer, Keith A. Jenkins, Michael Kies, Margaret Dolan, Kenneth J. Stein, John Malinowski, David L. Harame. Integrated RF components in a SiGe bipolar technology. J. Solid-State Circuits, 32(9):1440-1445, 1997. [doi]
Abstract is missing.