Pong-Fei Lu, Keith A. Jenkins, K. Paul Muller, Ralf Schaufler. Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 6, IEEE, 2015. [doi]
Abstract is missing.