Pong-Fei Lu, Keith A. Jenkins, K. Paul Muller, Ralf Schaufler. Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 6, IEEE, 2015. [doi]
@inproceedings{LuJMS15,
title = {Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology},
author = {Pong-Fei Lu and Keith A. Jenkins and K. Paul Muller and Ralf Schaufler},
year = {2015},
doi = {10.1109/IRPS.2015.7112756},
url = {http://dx.doi.org/10.1109/IRPS.2015.7112756},
researchr = {https://researchr.org/publication/LuJMS15},
cites = {0},
citedby = {0},
pages = {6},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7362-3},
}