Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology - researchr publication authors

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Pong-Fei Lu, Keith A. Jenkins, K. Paul Muller, Ralf Schaufler. Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 6, IEEE, 2015. [doi]

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