Saibal Mukhopadhyay, Kunhyuk Kang, Hamid Mahmoodi, Kaushik Roy. Reliable and self-repairing SRAM in nano-scale technologies using leakage and delay monitoring. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 10, IEEE, 2005. [doi]
@inproceedings{MukhopadhyayKMR05,
title = {Reliable and self-repairing SRAM in nano-scale technologies using leakage and delay monitoring},
author = {Saibal Mukhopadhyay and Kunhyuk Kang and Hamid Mahmoodi and Kaushik Roy},
year = {2005},
doi = {10.1109/TEST.2005.1584080},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1584080},
researchr = {https://researchr.org/publication/MukhopadhyayKMR05},
cites = {0},
citedby = {0},
pages = {10},
booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005},
publisher = {IEEE},
isbn = {0-7803-9038-5},
}