Saibal Mukhopadhyay, Kunhyuk Kang, Hamid Mahmoodi, Kaushik Roy. Reliable and self-repairing SRAM in nano-scale technologies using leakage and delay monitoring. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 10, IEEE, 2005. [doi]
Abstract is missing.