Reduction of Parametric Failures in Sub-100-nm SRAM Array Using Body Bias

Saibal Mukhopadhyay, Hamid Mahmoodi, Kaushik Roy. Reduction of Parametric Failures in Sub-100-nm SRAM Array Using Body Bias. IEEE Trans. on CAD of Integrated Circuits and Systems, 27(1):174-183, 2008. [doi]

Abstract

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