An apparatus for pseudo-deterministic testing

Shridhar K. Mukund, Edward J. McCluskey, T. R. N. Rao. An apparatus for pseudo-deterministic testing. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 125-131, IEEE Computer Society, 1995. [doi]

Authors

Shridhar K. Mukund

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Edward J. McCluskey

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T. R. N. Rao

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