Post-Silicon Validation: Automatic Characterization of RF Device Nonidealities via Iterative Learning Experiments on Hardware - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee. Post-Silicon Validation: Automatic Characterization of RF Device Nonidealities via Iterative Learning Experiments on Hardware. In 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, VLSID 2017, Hyderabad, India, January 7-11, 2017. pages 403-408, IEEE Computer Society, 2017. [doi]

This author has not been identified. Look up 'Barry John Muldrey' in GoogleThis author has not been identified. Look up 'Sabyasachi Deyati' in GoogleThis author has not been identified. Look up 'Abhijit Chatterjee' in Google

runs on WebDSL