Brendan Mullane, Vincent O'Brien, Ciaran MacNamee, Thomas Fleischmann. A2DTest: A complete integrated solution for on-chip ADC self-test and analysis. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-10, IEEE, 2009. [doi]
Abstract is missing.