Paley-Wiener Characterization of Kernels for Finite-Rate-of-Innovation Sampling

Satish Mulleti, Chandra Sekhar Seelamantula. Paley-Wiener Characterization of Kernels for Finite-Rate-of-Innovation Sampling. IEEE Transactions on Signal Processing, 65(22):5860-5872, 2017. [doi]

Abstract

Abstract is missing.