3D simulation of single-event-transient effects in symmetrical dual-material double-gate MOSFETs

Daniela Munteanu, Jean-Luc Autran. 3D simulation of single-event-transient effects in symmetrical dual-material double-gate MOSFETs. Microelectronics Reliability, 55(9-10):1522-1526, 2015. [doi]

Authors

Daniela Munteanu

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Jean-Luc Autran

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