3D simulation of single-event-transient effects in symmetrical dual-material double-gate MOSFETs

Daniela Munteanu, Jean-Luc Autran. 3D simulation of single-event-transient effects in symmetrical dual-material double-gate MOSFETs. Microelectronics Reliability, 55(9-10):1522-1526, 2015. [doi]

Abstract

Abstract is missing.