Masahiro Murakami, Haruo Kobayashi, Shaiful Nizam Bin Mohyar, Osamu Kobayashi, Takahiro Miki, Junya Kojima. I-Q signal generation techniques for communication IC testing and ATE systems. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-10, IEEE, 2016. [doi]
Abstract is missing.