Luis Gabriel Murillo, Simon Wawroschek, Jerónimo Castrillón, Rainer Leupers, Gerd Ascheid. Automatic detection of concurrency bugs through event ordering constraints. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014. pages 1-6, IEEE, 2014. [doi]
Abstract is missing.