External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Tags

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Self-Testing in Bit Serial VLSI Parts: High Coverage at Low Cost

Alan F. Murray, Peter B. Denyer, David S. Renshaw. Self-Testing in Bit Serial VLSI Parts: High Coverage at Low Cost. In Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983. pages 260-268, IEEE Computer Society, 1983.

Abstract

Abstract is missing.

runs on