A Mathematical Model for Optimum Error-Reject Trade-Off for Learning of Secure Classification Models in the Presence of Label Noise During Training

Seyedfakhredin Musavishavazi, Mehrdad Mohannazadeh Bakhtiari, Thomas Villmann. A Mathematical Model for Optimum Error-Reject Trade-Off for Learning of Secure Classification Models in the Presence of Label Noise During Training. In Leszek Rutkowski, Rafal Scherer, Marcin Korytkowski, Witold Pedrycz, Ryszard Tadeusiewicz, Jacek M. Zurada, editors, Artificial Intelligence and Soft Computing - 19th International Conference, ICAISC 2020, Zakopane, Poland, October 12-14, 2020, Proceedings, Part I. Volume 12415 of Lecture Notes in Computer Science, pages 547-554, Springer, 2020. [doi]

Abstract

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