SOC test compression scheme using sequential linear decompressors with retained free variables - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Sreenivaas S. Muthyala, Nur A. Touba. SOC test compression scheme using sequential linear decompressors with retained free variables. In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]

This author has not been identified. Look up 'Sreenivaas S. Muthyala' in GoogleThis author has not been identified. Look up 'Nur A. Touba' in Google

runs on WebDSL