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SOC test compression scheme using sequential linear decompressors with retained free variables

Sreenivaas S. Muthyala, Nur A. Touba. SOC test compression scheme using sequential linear decompressors with retained free variables. In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]

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