Onur Mutlu, Hyesoon Kim, Yale N. Patt. Address-Value Delta (AVD) Prediction: Increasing the Effectiveness of Runahead Execution by Exploiting Regular Memory Allocation Patterns. In 38th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO-38 2005), 12-16 November 2005, Barcelona, Spain. pages 233-244, IEEE Computer Society, 2005. [doi]
Abstract is missing.