Ayhan A. Mutlu, Jiayong Le, Ruben Molina, Mustafa Celik. Parametric analysis to determine accurate interconnect extraction corners for design performance. In 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA. pages 419-423, IEEE, 2009. [doi]
Abstract is missing.