Taesik Na, Saibal Mukhopadhyay. Behavioral modeling of timing slack variation in digital circuits due to power supply noise. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 281-284, IEEE, 2016. [doi]
Abstract is missing.