Roukoz Nabhan, Jean-Max Dutertre, Jean-Baptiste Rigaud, Jean-Luc Danger, Laurent Sauvage. Highlighting Two EM Fault Models While Analyzing a Digital Sensor Limitations. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2023, Antwerp, Belgium, April 17-19, 2023. pages 1-2, IEEE, 2023. [doi]
@inproceedings{NabhanDRDS23,
title = {Highlighting Two EM Fault Models While Analyzing a Digital Sensor Limitations},
author = {Roukoz Nabhan and Jean-Max Dutertre and Jean-Baptiste Rigaud and Jean-Luc Danger and Laurent Sauvage},
year = {2023},
doi = {10.23919/DATE56975.2023.10137124},
url = {https://doi.org/10.23919/DATE56975.2023.10137124},
researchr = {https://researchr.org/publication/NabhanDRDS23},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2023, Antwerp, Belgium, April 17-19, 2023},
publisher = {IEEE},
isbn = {978-3-9819263-7-8},
}