Highlighting Two EM Fault Models While Analyzing a Digital Sensor Limitations

Roukoz Nabhan, Jean-Max Dutertre, Jean-Baptiste Rigaud, Jean-Luc Danger, Laurent Sauvage. Highlighting Two EM Fault Models While Analyzing a Digital Sensor Limitations. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2023, Antwerp, Belgium, April 17-19, 2023. pages 1-2, IEEE, 2023. [doi]

Abstract

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