Improved Core Isolation and Access for Hierarchical Embedded Test

Benoit Nadeau-Dostie, Saman Adham, Russ Abbott. Improved Core Isolation and Access for Hierarchical Embedded Test. IEEE Design & Test of Computers, 26(1):18-25, 2009. [doi]

Authors

Benoit Nadeau-Dostie

This author has not been identified. Look up 'Benoit Nadeau-Dostie' in Google

Saman Adham

This author has not been identified. Look up 'Saman Adham' in Google

Russ Abbott

This author has not been identified. Look up 'Russ Abbott' in Google