Benoit Nadeau-Dostie, Saman Adham, Russ Abbott. Improved Core Isolation and Access for Hierarchical Embedded Test. IEEE Design & Test of Computers, 26(1):18-25, 2009. [doi]
@article{Nadeau-DostieAA09,
title = {Improved Core Isolation and Access for Hierarchical Embedded Test},
author = {Benoit Nadeau-Dostie and Saman Adham and Russ Abbott},
year = {2009},
doi = {10.1109/MDT.2009.13},
url = {http://dx.doi.org/10.1109/MDT.2009.13},
tags = {testing},
researchr = {https://researchr.org/publication/Nadeau-DostieAA09},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {26},
number = {1},
pages = {18-25},
}