Muhammad Ferjad Naeem, Seong Joon Oh, Youngjung Uh, Yunjey Choi, Jaejun Yoo. Reliable Fidelity and Diversity Metrics for Generative Models. In Proceedings of the 37th International Conference on Machine Learning, ICML 2020, 13-18 July 2020, Virtual Event. Volume 119 of Proceedings of Machine Learning Research, pages 7176-7185, PMLR, 2020. [doi]
Abstract is missing.