An integrated DFT solution for power reduction in scan test applications by low power gating scan cell - researchr publication

researchr

You are not signed in
Sign in
Sign up

Mahshid Mojtabavi Naeini, Sreedharan Baskara Dass, Chia Yee Ooi, Tomokazu Yoneda, Michiko Inoue. An integrated DFT solution for power reduction in scan test applications by low power gating scan cell. Integration, 57:108-124, 2017. [doi]

Abstract is missing.

runs on WebDSL