Makoto Nagata, Daisuke Fujimoto, Noriyuki Miura. On-Chip Monitoring for In-Place Diagnosis of Undesired Power Domain Problems in IC Chips. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 258-262, IEEE Computer Society, 2014. [doi]
Abstract is missing.