Makoto Nagata, Yoshitaka Murasaka, Youichi Nishimori, Takashi Morie, Atsushi Iwata. Substrate Noise Analysis with Compact Digital Noise Injection and Substrate Models. In Proceedings of the ASPDAC 2002 / VLSI Design 2002, CD-ROM, 7-11 January 2002, Bangalore, India. pages 71-76, IEEE Computer Society, 2002. [doi]
@inproceedings{NagataMNMI02,
title = {Substrate Noise Analysis with Compact Digital Noise Injection and Substrate Models},
author = {Makoto Nagata and Yoshitaka Murasaka and Youichi Nishimori and Takashi Morie and Atsushi Iwata},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/vlsid/2002/1441/00/14410071abs.htm},
tags = {analysis},
researchr = {https://researchr.org/publication/NagataMNMI02},
cites = {0},
citedby = {0},
pages = {71-76},
booktitle = {Proceedings of the ASPDAC 2002 / VLSI Design 2002, CD-ROM, 7-11 January 2002, Bangalore, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-1299-2},
}