Substrate Noise Analysis with Compact Digital Noise Injection and Substrate Models

Makoto Nagata, Yoshitaka Murasaka, Youichi Nishimori, Takashi Morie, Atsushi Iwata. Substrate Noise Analysis with Compact Digital Noise Injection and Substrate Models. In Proceedings of the ASPDAC 2002 / VLSI Design 2002, CD-ROM, 7-11 January 2002, Bangalore, India. pages 71-76, IEEE Computer Society, 2002. [doi]

Abstract

Abstract is missing.