Naveena Nagi, Abhijit Chatterjee, Ashok Balivada, Jacob A. Abraham. Fault-based automatic test generator for linear analog circuits. In Michael R. Lightner, Jochen A. G. Jess, editors, Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993, Santa Clara, California, USA, November 7-11, 1993. pages 88-91, IEEE Computer Society, 1993. [doi]
Abstract is missing.