Yoshihiro Nagura, Michael Mullins, Anthony Sauvageau, Yoshinoro Fujiwara, Katsuya Furue, Ryuji Ohmura, Tatsunori Komoike, Takenori Okitaka, Tetsushi Tanizaki, Katsumi Dosaka, Kazutami Arimoto, Yukiyoshi Koda, Tetsuo Tada. Test cost reduction by at-speed BISR for embedded DRAMs. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 182-187, IEEE Computer Society, 2001.
@inproceedings{NaguraMSFFOKOTDAKT01,
title = {Test cost reduction by at-speed BISR for embedded DRAMs},
author = {Yoshihiro Nagura and Michael Mullins and Anthony Sauvageau and Yoshinoro Fujiwara and Katsuya Furue and Ryuji Ohmura and Tatsunori Komoike and Takenori Okitaka and Tetsushi Tanizaki and Katsumi Dosaka and Kazutami Arimoto and Yukiyoshi Koda and Tetsuo Tada},
year = {2001},
tags = {testing},
researchr = {https://researchr.org/publication/NaguraMSFFOKOTDAKT01},
cites = {0},
citedby = {0},
pages = {182-187},
booktitle = {Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001},
publisher = {IEEE Computer Society},
isbn = {0-7803-7169-0},
}