Pseudorandom Testing for Boundary-Scan Design with Built-In Self-Test

Prawat Nagvajara, Mark G. Karpovsky, Lev B. Levitin. Pseudorandom Testing for Boundary-Scan Design with Built-In Self-Test. IEEE Design & Test of Computers, 8(3):58-65, 1991. [doi]

Authors

Prawat Nagvajara

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Mark G. Karpovsky

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Lev B. Levitin

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