Prawat Nagvajara, Mark G. Karpovsky, Lev B. Levitin. Pseudorandom Testing for Boundary-Scan Design with Built-In Self-Test. IEEE Design & Test of Computers, 8(3):58-65, 1991. [doi]
@article{NagvajaraKL91,
title = {Pseudorandom Testing for Boundary-Scan Design with Built-In Self-Test},
author = {Prawat Nagvajara and Mark G. Karpovsky and Lev B. Levitin},
year = {1991},
doi = {10.1109/54.84245},
url = {http://doi.ieeecomputersociety.org/10.1109/54.84245},
tags = {testing, design},
researchr = {https://researchr.org/publication/NagvajaraKL91},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {8},
number = {3},
pages = {58-65},
}