Dedicated Autonomous Scan-Based Testing (DAST) for Embedded Cores - researchr publication authors

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Mohsen Nahvi, André Ivanov, Resve A. Saleh. Dedicated Autonomous Scan-Based Testing (DAST) for Embedded Cores. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 1176-1184, IEEE Computer Society, 2002. [doi]

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