Mohsen Nahvi, André Ivanov, Resve A. Saleh. Dedicated Autonomous Scan-Based Testing (DAST) for Embedded Cores. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 1176-1184, IEEE Computer Society, 2002. [doi]
@inproceedings{NahviIS02,
title = {Dedicated Autonomous Scan-Based Testing (DAST) for Embedded Cores},
author = {Mohsen Nahvi and André Ivanov and Resve A. Saleh},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75431176.pdf},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/NahviIS02},
cites = {0},
citedby = {0},
pages = {1176-1184},
booktitle = {Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002},
publisher = {IEEE Computer Society},
}