DDQ testing

Samir B. Naik, Wojciech P. Maly. DDQ testing. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 106-108, IEEE, 1993. [doi]

Authors

Samir B. Naik

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Wojciech P. Maly

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