Samir B. Naik, Wojciech P. Maly. DDQ testing. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 106-108, IEEE, 1993. [doi]
@inproceedings{NaikM93,
title = {DDQ testing},
author = {Samir B. Naik and Wojciech P. Maly},
year = {1993},
doi = {10.1109/VTEST.1993.313300},
url = {http://dx.doi.org/10.1109/VTEST.1993.313300},
researchr = {https://researchr.org/publication/NaikM93},
cites = {0},
citedby = {0},
pages = {106-108},
booktitle = {11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA},
publisher = {IEEE},
isbn = {0-8186-3830-3},
}