Sarath Mohanachandran Nair, Rajendra Bishnoi, Mohammad Saber Golanbari, Fabian Oboril, Mehdi Baradaran Tahoori. VAET-STT: A variation aware estimator tool for STT-MRAM based memories. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 1456-1461, IEEE, 2017. [doi]
@inproceedings{NairBGOT17,
title = {VAET-STT: A variation aware estimator tool for STT-MRAM based memories},
author = {Sarath Mohanachandran Nair and Rajendra Bishnoi and Mohammad Saber Golanbari and Fabian Oboril and Mehdi Baradaran Tahoori},
year = {2017},
doi = {10.23919/DATE.2017.7927221},
url = {https://doi.org/10.23919/DATE.2017.7927221},
researchr = {https://researchr.org/publication/NairBGOT17},
cites = {0},
citedby = {0},
pages = {1456-1461},
booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017},
editor = {David Atienza and Giorgio Di Natale},
publisher = {IEEE},
isbn = {978-3-9815370-8-6},
}