VISION: an efficient parallel pattern fault simulator for synchronous sequential circuits

Rajesh Nair, Dong Sam Ha. VISION: an efficient parallel pattern fault simulator for synchronous sequential circuits. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 221-226, IEEE Computer Society, 1995. [doi]

Authors

Rajesh Nair

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Dong Sam Ha

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