Computation of bus current variance for reliability estimation of VLSI circuits

Farid N. Najm, Ibrahim N. Hajj, Ping Yang. Computation of bus current variance for reliability estimation of VLSI circuits. In 1989 IEEE International Conference on Computer-Aided Design, ICCAD 1989, Santa Clara, CA, USA, November 5-9, 1989. Digest of Technical Papers. pages 202-205, IEEE, 1989. [doi]

Abstract

Abstract is missing.