Farid N. Najm, Ibrahim N. Hajj, Ping Yang 0001. Electromigration median time-to-failure based on a stochastic current waveform. In Computer Design: VLSI in Computers and Processors, ICCD 1989. Proceedings., 1989 IEEE International Conference on, Cambridge, MA, USA, October 2-4, 1989. pages 447-450, IEEE, 1989. [doi]
Abstract is missing.