Farid N. Najm, Valeriy Sukharev. Efficient Simulation of Electromigration Damage in Large Chip Power Grids Using Accurate Physical Models (Invited Paper). In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-10, IEEE, 2019. [doi]
Abstract is missing.