Reduction of Defect Misclassification of Electronic Board Using Multiple SVM Classifiers

Takuya Nakagawa, Yuji Iwahori, Manas Kamal Bhuyan. Reduction of Defect Misclassification of Electronic Board Using Multiple SVM Classifiers. IJSI, 2(1):25-36, 2014. [doi]

Authors

Takuya Nakagawa

This author has not been identified. Look up 'Takuya Nakagawa' in Google

Yuji Iwahori

This author has not been identified. Look up 'Yuji Iwahori' in Google

Manas Kamal Bhuyan

This author has not been identified. Look up 'Manas Kamal Bhuyan' in Google