Takuya Nakagawa, Yuji Iwahori, Manas Kamal Bhuyan. Reduction of Defect Misclassification of Electronic Board Using Multiple SVM Classifiers. IJSI, 2(1):25-36, 2014. [doi]
@article{NakagawaIB14,
title = {Reduction of Defect Misclassification of Electronic Board Using Multiple SVM Classifiers},
author = {Takuya Nakagawa and Yuji Iwahori and Manas Kamal Bhuyan},
year = {2014},
doi = {10.4018/ijsi.2014010103},
url = {http://dx.doi.org/10.4018/ijsi.2014010103},
researchr = {https://researchr.org/publication/NakagawaIB14},
cites = {0},
citedby = {0},
journal = {IJSI},
volume = {2},
number = {1},
pages = {25-36},
}