Reduction of Defect Misclassification of Electronic Board Using Multiple SVM Classifiers

Takuya Nakagawa, Yuji Iwahori, Manas Kamal Bhuyan. Reduction of Defect Misclassification of Electronic Board Using Multiple SVM Classifiers. IJSI, 2(1):25-36, 2014. [doi]

Abstract

Abstract is missing.