Yoshiyuki Nakamura, Masashi Tanaka. A Multi-dimensional Iddq Testing Method Using Mahalanobis Distance. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 303-309, IEEE Computer Society, 2010. [doi]
Abstract is missing.