Yohei Nakata, Yuta Kimi, Shunsuke Okumura, Jinwook Jung, Takuya Sawada, Taku Toshikawa, Makoto Nagata, Hirofumi Nakano, Makoto Yabuuchi, Hidehiro Fujiwara, Koji Nii, Hiroyuki Kawai, Hiroshi Kawaguchi, Masahiko Yoshimoto. A 40-nm resilient cache memory for dynamic variation tolerance with bit-enhancing memory and on-chip diagnosis structures delivering ×91 failure rate improvement. In Fifteenth International Symposium on Quality Electronic Design, ISQED 2014, Santa Clara, CA, USA, March 3-5, 2014. pages 16-23, IEEE, 2014. [doi]
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